Projektnummer

0053538

Zusammenfassung

The failure analysis of Integrated Circuits (IC) is a significant challenge in modern high-tech solid-state electronics development and manufacturing. At present different methods and techniques are used in failure analysis of ICs. Among these techniques, the Thermal Laser Stimulation Technique is particularly successful because it is non- invasive and relatively fast. The (traditional) Thermal Laser Stimulation technique uses a Near Infrared (NIR) laser beam to thermally stimulate ICs. At present the NIR laser beam influence on the performance of different active electronic devices of...